Title :
AL/NI multilayer used as a local heat source for mounting microelectronic components
Author :
Zhang, Jun ; Wu, Feng-Shun ; Zou, Jian ; An, Bing ; Liu, Hui
Author_Institution :
Wuhan Nat. Lab. for Optoelectron., Huazhong Univ. of Sci. & Technol., Wuhan, China
Abstract :
This paper describes a novel local heating technique for microelectronic mounting. Aluminum/nickel (Al/Ni) multilayer foils show self-propagating exothermic reactions, driven by a reduction in atomic bond energy which can provide rapid bursts of heat and can act as a local heat source to melt solder layers and join materials. In this work, we demonstrate the validity of the Al/Ni reactive foils as a heat source in microelectronic mounting by joining a tiny sheet coppers to a printed circuit board. The Al/Ni multilayer was made by cooled rolling. Thermal analysis of the exothermic reactions in Al/Ni multilayer films was made to make sure that the bonding process is feasible theoretically. The interface of the bonding and the reaction product of the reactive Al/Ni foils was characterized by using Scanning Electron Microscope (SEM) and Energy Dispersive X-ray Detector (EDX).
Keywords :
X-ray chemical analysis; aluminium; cold rolling; foils; multilayers; nickel; printed circuits; scanning electron microscopy; soldering; solders; surface mount technology; thermal analysis; Al-Ni; atomic bond energy; bonding process; cold rolling; energy dispersive X-ray detector; joining; local heat source; local heating technique; melt solder layers; microelectronic mounting; multilayer films; multilayer foils; printed circuit board; reactive foils; scanning electron microscope; self-propagating exothermic reactions; thermal analysis; tiny sheet coppers; Aluminum; Atomic layer deposition; Bonding; Heating; Joining materials; Microelectronics; Nickel; Nonhomogeneous media; Scanning electron microscopy; Sheet materials;
Conference_Titel :
Electronic Packaging Technology & High Density Packaging, 2009. ICEPT-HDP '09. International Conference on
Conference_Location :
Beijing
Print_ISBN :
978-1-4244-4658-2
Electronic_ISBN :
978-1-4244-4659-9
DOI :
10.1109/ICEPT.2009.5270630