Title :
Applicability of an integrated model-based testing approach for RTES
Author :
Iyenghar, Padma ; Spieker, Michael ; Tecker, Pablo ; Wuebbelmann, Juergen ; Westerkamp, Clemens ; Van der Heiden, Walter ; Willert, Andreas
Author_Institution :
Inst. of Comput. Eng., UAS, Osnabruck, Germany
Abstract :
The increasing complexity and wide applicability of Real-Time Embedded Systems (RTES) necessitates use of advanced and automated development and testing methodologies to meet time-to-market constraints, quality assurance and safety standards. In this context, the applicability of Model Driven Development (MDD) and Model-Based Testing (MBT) methodologies for RTES have been gaining attention in the recent decade. MBT approaches, in general, helps in automatically generating test cases using models extracted from software artifacts. However, currently none of the existing MBT approaches deal with generating test artifacts for executing and verifying these test cases in memory size constrained and code-size critical RTES. To address this, an integrated MBT approach for executing the test stimuli in the RTES (without dynamic source code instrumentation) is discussed in this paper. A prototype implementation is discussed followed by an experimental evaluation of this approach for an RTES example. Finally, this paper presents a perspective on the applicability of model-based approach for industrial RTES projects.
Keywords :
embedded systems; program testing; software quality; automated development; dynamic source code instrumentation; integrated model-based testing; model driven development; quality assurance; real-time embedded systems; safety standards; software artifacts; testing methodologies; time-to-market constraints; Data models; Embedded systems; Mathematical model; Monitoring; Real time systems; Testing; Unified modeling language;
Conference_Titel :
Industrial Informatics (INDIN), 2011 9th IEEE International Conference on
Conference_Location :
Caparica, Lisbon
Print_ISBN :
978-1-4577-0435-2
Electronic_ISBN :
978-1-4577-0433-8
DOI :
10.1109/INDIN.2011.6035008