• DocumentCode
    3520435
  • Title

    A simple method to estimate relative permittivity and tangent loss of printed circuit board materials

  • Author

    Montoya Montoya, Ronal D. ; Gaviria Gomez, Natalia

  • Author_Institution
    Dept. of Electron. Eng., Univ. of Antioquia, Medellin, Colombia
  • fYear
    2013
  • fDate
    24-26 Nov. 2013
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    This paper presents a simple and low cost method to estimate relative permittivity and tangent loss for dielectric sheets used in printed circuit boards (PCB´s). The process starts by building a rectangular cavity in a very easy manner. As an example, the results to estimate relative permittivity and tangent loss of a fiber glass PCB are shown. The relative permittivity and tangent loss are presented as a function of frequency. To obtain resonant frequencies, the return loss (S11) was measured using a vector network analyzer (VNA). Relative permittivity and tangent loss were estimated at the frequencies of the excited modes in the resonant cavity. The results are presented in a frequency span of 1 GHz to 11 GHz. The nonlinear behavior of the relative permittivity and tangent loss for the dielectric material evaluated are presented. The relative permittivity exhibites a stable behavior at high frequencies while the tangent loss is shown to increase with frequency.
  • Keywords
    dielectric materials; network analysers; permittivity; printed circuits; VNA; dielectric material; dielectric sheets; fiber glass PCB; frequency 1 GHz to 11 GHz; printed circuit board materials; rectangular cavity; relative permittivity; resonant cavity; return loss; tangent loss; vector network analyzer; Cavity resonators; Frequency estimation; Loss measurement; Permittivity; Permittivity measurement; Resonant frequency; Dielectric; UWB; relative permittivity; resonant cavity; return loss; tangent loss;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Communications (LATINCOM), 2013 IEEE Latin-America Conference on
  • Conference_Location
    Santiago
  • Print_ISBN
    978-1-4799-1146-2
  • Type

    conf

  • DOI
    10.1109/LatinCom.2013.6759821
  • Filename
    6759821