Title :
The warpage control method in epoxy molding compound
Author :
Tan, Wei ; Zhou, Fang ; Cheng, Xingming ; Ding, Dong ; Wu, Juan
Author_Institution :
Henkel Huawei Electron. Co., Ltd., Lianyungang, China
Abstract :
This paper is to study the warpage impact of filler content and special additives on BGA packages. The special additives have significant impact on the warpage. The additive A has great influence on the warpage at different temperature; the warpage will flatten when more additive A is added. From the warpage study of single unit from room temperature to 260degC, all the warpage is in 50um when additive A is about 1%. The additive A can flatten the warpage of the package and keep the warpage at same level even with different silicon occupation in the package. The filler content shows great impact on the warpage by control the shrinkage after cured, the lower shrinkage; the package will move to more crying.
Keywords :
ball grid arrays; curing; elemental semiconductors; moulding; shrinkage; silicon; BGA package; Si; epoxy molding compound; filler content warpage impact; shrinkage curing; size 50 mum; temperature 260 degC; temperature 293 K to 298 K; warpage control method; Additives; Assembly; Electronics packaging; Microassembly; Plastic packaging; Plastics industry; Resistance heating; Silicon; Temperature sensors; Testing;
Conference_Titel :
Electronic Packaging Technology & High Density Packaging, 2009. ICEPT-HDP '09. International Conference on
Conference_Location :
Beijing
Print_ISBN :
978-1-4244-4658-2
Electronic_ISBN :
978-1-4244-4659-9
DOI :
10.1109/ICEPT.2009.5270653