DocumentCode :
3520460
Title :
SRC Summer 1996 Continuous Quality Improvement
Author :
Kuehn, Richard ; Rying, Eric ; Maher, Dennis ; Ottaviani, Diana ; Lu, Jye-Chyi ; Harding, Brian
Author_Institution :
Dept. of Electr. & Comput. Eng., North Carolina State Univ., Raleigh, NC, USA
fYear :
1997
fDate :
20-23 Jul 1997
Firstpage :
61
Lastpage :
65
Abstract :
In May of 1996, the Engineering Research Center for Advanced Electronic Materials Processing (ERC for AEMP) at North Carolina State University (NCSU) received funding from the Semiconductor Research Corporation (SRC) to pursue what is called the SRC Summer ´96 Continuous Quality Improvement Initiative. As a result of this situation, three graduate students were selected to participate in the project and a number of researchers from the ERC-AEMP were brought on board to support the effort. The objective of the project was to continuously improve the quality of an in situ gate-stack process for the across-stage fabrication of MOS capacitors. The research pathways to achieve this objective were process characterization as well as definition, materials analysis and statistical analysis. This paper will discuss the key issues in this effort
Keywords :
MOS capacitors; integrated circuit yield; quality control; research initiatives; statistical analysis; Advanced Electronic Materials Processing; Engineering Research Center; MOS capacitors; North Carolina State University; Semiconductor Research Corporation; across-stage fabrication; continuous quality improvement; in situ gate-stack process; materials analysis; process characterization; researchers; statistical analysis; Amorphous silicon; Electrodes; Furnaces; Oxidation; Poles and towers; Raman scattering; Semiconductor films; Spectroscopy; Temperature; Throughput;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
University/Government/Industry Microelectronics Symposium, 1997., Proceedings of the Twelfth Biennial
Conference_Location :
Rochester, NY
ISSN :
0749-6877
Print_ISBN :
0-7803-3790-5
Type :
conf
DOI :
10.1109/UGIM.1997.616683
Filename :
616683
Link To Document :
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