DocumentCode :
3520518
Title :
Electrochemical corrosion behaviour of Sn-8Zn-3Bi-XCr solder in 3.5% NaCl
Author :
Hu, Jing ; Hu, Anmin ; Li, Ming ; Mao, Dali
Author_Institution :
Shanghai Jiao Tong Univ., Shanghai, China
fYear :
2009
fDate :
10-13 Aug. 2009
Firstpage :
701
Lastpage :
707
Abstract :
This paper has explored the using of Cr micro-alloying method to enhance the corrosion resistance of Sn-Zn-Bi alloy. In addition, the influence of long-term aging on solder corrosion resistance has been studied. The electrochemical corrosion behaviour of Sn-8Zn-3Bi-XCr solder in 3.5% NaCl solution was investigated by using potentiodynamic polarization methods, scanning electron microscopy (SEM), energy-dispersive X-ray spectroscopy (EDX) and X-ray an X-RAY diffractometer (XRD) analysis. The results obtained from polarization study show that: adding a small amount of Cr can improve the corrosion resistance of Sn-Zn-Bi alloy. It shifted the corrosion potential towards more noble values. This change was also reflected in the current density of solder alloy in passivation, corrosion rate, respectively. The oxides of zinc were responsible for the formation of passive film. Presence of Cr atoms in the oxide layer also improved the passivation behaviour of solders to a certain extent and the Sn-9Zn-3Bi-0.5Cr has the best resistance property. We can see from the SEM that it has proportional passive film. Long-term aging decreases the corrosion resistance property and it became poorer with prolonging the aging time. However, it is also more difficult to form passive film.
Keywords :
X-ray chemical analysis; X-ray diffractometers; corrosion; current density; scanning electron microscopy; solders; tin alloys; Sn-Zn-Bi-Cr; X-ray diffractometer analysis; corrosion resistance; current density; electrochemical corrosion behaviour; energy-dispersive X-ray spectroscopy; long-term aging; micro-alloying method; potentiodynamic polarization methods; scanning electron microscopy; solder alloy; Aging; Chromium alloys; Corrosion; Current density; Passivation; Polarization; Scanning electron microscopy; Spectroscopy; X-ray diffraction; X-ray scattering;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Packaging Technology & High Density Packaging, 2009. ICEPT-HDP '09. International Conference on
Conference_Location :
Beijing
Print_ISBN :
978-1-4244-4658-2
Electronic_ISBN :
978-1-4244-4659-9
Type :
conf
DOI :
10.1109/ICEPT.2009.5270657
Filename :
5270657
Link To Document :
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