Abstract :
The following topics are dealt with: semiconductor device reliability; nanowires; memory; spin; and transport.
Keywords :
nanowires; semiconductor device reliability; storage management chips; transport processes; memory; nanowires; semiconductor device reliability; spin; transport;
Conference_Titel :
Simulation of Semiconductor Processes and Devices (SISPAD), 2011 International Conference on
Conference_Location :
Osaka
Print_ISBN :
978-1-61284-419-0
DOI :
10.1109/SISPAD.2011.6035021
