• DocumentCode
    352082
  • Title

    Multi-aspect target classification using hidden Markov models for data fusion

  • Author

    Runkle, Paul ; Carin, Lawrence ; Nguyen, Lam

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Duke Univ., Durham, NC, USA
  • Volume
    5
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    2123
  • Abstract
    Tactical targets often exhibit a monostatic response that is a function of target-sensor orientation. In SAR image formation, this aspect dependence is lost through integration over the synthetic aperture. The aspect dependent response may be recovered through directional filtering of the focused image, yielding a sequence of subaperture images. The response of a target at an unknown orientation is subsequently modeled using the feature statistics of the subaperture image sequence in conjunction with a hidden Markov model (HMM), with the states of the HMM corresponding to target-sensor intervals over which the target response is relatively invariant. The features extracted from each observation are derived from two-dimensional matching pursuits. Performance is quantified against standard parametric detection architectures for measured data
  • Keywords
    hidden Markov models; image classification; military radar; radar detection; radar imaging; sensor fusion; synthetic aperture radar; SAR; aspect dependence; data fusion; directional filtering; focused image; hidden Markov model; military radar; monostatic response; multi-aspect target classification; multiaspect classification; radar detection; radar imaging; subaperture image; subaperture image sequence; synthetic aperture radar; tactical target; target-sensor orientation; unknown orientation; Data mining; Feature extraction; Filtering; Focusing; Hidden Markov models; Image sequences; Matching pursuit algorithms; Measurement standards; Parametric statistics; Synthetic aperture radar;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Geoscience and Remote Sensing Symposium, 2000. Proceedings. IGARSS 2000. IEEE 2000 International
  • Conference_Location
    Honolulu, HI
  • Print_ISBN
    0-7803-6359-0
  • Type

    conf

  • DOI
    10.1109/IGARSS.2000.858316
  • Filename
    858316