DocumentCode :
3520864
Title :
Microstructural evolution of Sn-3.5Ag solder with lanthanum addition
Author :
Lee, Hwa-Teng ; Chen, Yin-Fa ; Hong, Ting-Fu ; Shih, Ku-Ta ; Hsu, Che-Wei
Author_Institution :
Dept. of Mech. Eng., Cheng Kung Univ., Tainan, Taiwan
fYear :
2009
fDate :
10-13 Aug. 2009
Firstpage :
617
Lastpage :
622
Abstract :
The goal of this research is to evaluate the effects of La addition on the microstructure and microhardness of Sn-Ag based solders. Sn-3.5Ag-xLa ternary alloy solders were prepared by adding 0-1.0 wt% La into a Sn-3.5Ag alloy. Copper substrates were then dipped into these solders and aged at 150degC for up to 625 hours. The microstructure and microhardness of the as solidified solder and the aged solder/copper couples were investigated. Experimental results show that Sn-3.5Ag-xLa solders are composed of beta-Sn, Ag3Sn, and LaSn3 phases, and that their microstructure is refined with La addition. After isothermal storage, the Ag3Sn and IMC layer can be effectively depressed by adding a small amount of La element, and the size and amount of LaSn3 compounds does not change perceptibly with storage time. For as-cast solder, the addition of La increased the microhardness of the Sn-Ag solder due to the refining effect of Ag3Sn particles in the eutectic zone and increased formation of LaSn3 compound. After isothermal storage, the microhardness of solders was decreased with the increasing coarsening of Ag3Sn compounds as aging time was increased. However, coarsening of Ag3Sn compounds was retarded by La addition. Therefore, La addition helped to improve the microhardness and thermal resistance of the solder joints.
Keywords :
lanthanum alloys; microhardness; silver alloys; solders; tin alloys; Ag3Sn; Cu; LaSn3; Sn-Ag-La; cast solder; eutectic alloy; isothermal storage; solder; temperature 150 degC; ternary alloy solder; thermal resistance; Aging; Copper; Isothermal processes; Lanthanum; Mechanical factors; Microstructure; Optical microscopy; Soldering; Temperature; Thermal resistance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Packaging Technology & High Density Packaging, 2009. ICEPT-HDP '09. International Conference on
Conference_Location :
Beijing
Print_ISBN :
978-1-4244-4658-2
Electronic_ISBN :
978-1-4244-4659-9
Type :
conf
DOI :
10.1109/ICEPT.2009.5270676
Filename :
5270676
Link To Document :
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