DocumentCode :
3521055
Title :
KNACK: A hybrid spin-charge mixed-mode simulator for evaluating different genres of spin-transfer torque MRAM bit-cells
Author :
Fong, Xuanyao ; Gupta, Sumeet K. ; Mojumder, Niladri N. ; Choday, Sri Harsha ; Augustine, Charles ; Roy, Kaushik
Author_Institution :
Dept. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA
fYear :
2011
fDate :
8-10 Sept. 2011
Firstpage :
51
Lastpage :
54
Abstract :
The storage device in spin-transfer torque MRAM (STT-MRAM) is the magnetic tunneling junction (MTJ) and several models for the MTJ have been proposed. However, a simulation framework that captures device physics at the atomistic level when simulating STT-MRAM at the bit-cell level is lacking. We propose a simulation framework (KNACK) which models the MTJ at the atomistic level using the Non-Equilibrium Green´s Function (NEGF) formalism and uses the NEGF model in conjunction with our STT-MRAM bit-cell circuit model for circuit-level simulations. Our simulation framework accepts I-V and C-V characteristics of the access device input either as lookup tables or as compact models. We show that with appropriate device and bit-cell parameters, our simulation framework has the ability to capture MTJ physics and simulate different genres of STT-MRAM bit-cells with results in agreement with experiments.
Keywords :
Green´s function methods; MRAM devices; integrated circuit modelling; magnetic tunnelling; C-V characteristics; I-V characteristics; KNACK simulation framework; NEGF model; STT-MRAM bit-cell circuit model; circuit-level simulations; hybrid spin-charge mixed-mode simulator; lookup tables; magnetic tunneling junction; nonequilibrium Green´s function method; spin-transfer torque MRAM bit-cells; storage device; Integrated circuit modeling; Magnetic tunneling; Magnetomechanical effects; Mathematical model; Perpendicular magnetic anisotropy; Saturation magnetization; STT-MRAM; Spin-transfer torque; magnetic tunneling junction; modeling; simulation framework;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Simulation of Semiconductor Processes and Devices (SISPAD), 2011 International Conference on
Conference_Location :
Osaka
ISSN :
1946-1569
Print_ISBN :
978-1-61284-419-0
Type :
conf
DOI :
10.1109/SISPAD.2011.6035047
Filename :
6035047
Link To Document :
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