DocumentCode :
3521109
Title :
Quantum electronic trap-to-band transitions in chalcogenides induced by electron-electron interaction
Author :
Buscemi, F. ; Piccinini, E. ; Giovanardi, F. ; Rudan, M. ; Brunetti, R. ; Jacoboni, C.
Author_Institution :
Dept. of Electron., Comput. Sci. & Syst., Univ. of Bologna, Bologna, Italy
fYear :
2011
fDate :
8-10 Sept. 2011
Firstpage :
67
Lastpage :
70
Abstract :
Charge transport in amorphous-chalcogenide materials used for manufacturing memory devices is determined by two mechanisms: hopping of trapped electrons and motion of band electrons. Electron-electron interaction is investigated here as one of the mechanisms mainly responsible for the trap-to-band transitions. The problem is tackled using a fully quantum-mechanical approach by numerically solving the two-particle, time-dependent Schrödinger equation. The results show that the detrapping probability increases with the current density, this supporting the interpretation by which successive electron-electron scattering events may play a major role in the determining the snap-back of the I(V) characteristic in this kind of materials.
Keywords :
Schrodinger equation; amorphous state; current density; exchange interactions (electron); quantum theory; I(V) characteristic; amorphous-chalcogenide materials; band electron motion; current density; electron-electron interaction; manufacturing memory devices; quantum electronic trap-to-band transitions; quantum-mechanical approach; time-dependent Schrodinger equation; trapped electron hopping; two-particle equation; Current density; Electron traps; Equations; Materials; Resistance; Scattering;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Simulation of Semiconductor Processes and Devices (SISPAD), 2011 International Conference on
Conference_Location :
Osaka
ISSN :
1946-1569
Print_ISBN :
978-1-61284-419-0
Type :
conf
DOI :
10.1109/SISPAD.2011.6035051
Filename :
6035051
Link To Document :
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