DocumentCode
352115
Title
Restructuring of the flash A/D converter to improve SEU rad tolerance
Author
Monnier, T. ; Roche, F.M. ; Corbière, F.
Author_Institution
Lab. d´´Inf. de Robotique et de Microelectron., Univ. des Sci. et Tech. du Languedoc, Montpellier, France
fYear
1999
fDate
1999
Firstpage
353
Lastpage
357
Abstract
The purpose of this work is to present how structural changes in the conventional Flash Analog to Digital Converter can secure it for a harsh radiation environment. The method consists in a coupling of two complementary techniques: a robust reconfiguration of the logical structure joined to a design hardening of the individual blocks. This approach preserves the ADC performances
Keywords
analogue-digital conversion; integrated circuit modelling; integrated logic circuits; radiation hardening (electronics); ADC performance; SEU rad tolerance; design hardening; flash A/D converter; flash analog-digital converter; harsh radiation environment; logical structure; restructuring; robust reconfiguration; Analog-digital conversion; Computer errors; Coupling circuits; Digital circuits; Flip-flops; Radiation hardening; Resistors; Robots; Robustness; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Radiation and Its Effects on Components and Systems, 1999. RADECS 99. 1999 Fifth European Conference on
Conference_Location
Fontevraud
Print_ISBN
0-7803-5726-4
Type
conf
DOI
10.1109/RADECS.1999.858607
Filename
858607
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