DocumentCode :
3521554
Title :
Bonding head design for thin wafer
Author :
Lee, Changwoo ; Lee, Jaehak ; Ha, Tae Ho ; Song, Junyeob
Author_Institution :
Dep. of Ultra Precision Machines & Syst., Korea Inst. of Machinery & Mater., Daejeon, South Korea
fYear :
2009
fDate :
9-11 Dec. 2009
Firstpage :
220
Lastpage :
224
Abstract :
In this paper, porous vacuum picker and bonding head to impose uniform pressure on all the surface of wafer in the bonding process are proposed newly. Porous vacuum picker could reduce deformation and warpage problem during handling thin wafer because it has many number of small vacuum hole which induce small vacuum pressure at those holes region. Also, to impose uniform pressure on the wafer under bonding process, bonding head is designed using air piston type with metal ball joint, which automatically compensate for coplanarity problem of bonding pad. FEM analysis and experiments are conducted to evaluate the performance of porous vacuum picker and bonding head of air piston type.
Keywords :
finite element analysis; wafer bonding; FEM analysis; bonding head design; bonding pad; bonding process; coplanarity problem; deformation; finite element method; metal ball joint; porous vacuum picker; thin wafer handling; thin wafer surface; vacuum hole; vacuum pressure; warpage problem; Bonding processes; Fabrication; Machinery; Machining; Magnetic heads; Packaging; Pistons; Vacuum systems; Vacuum technology; Wafer bonding;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics Packaging Technology Conference, 2009. EPTC '09. 11th
Conference_Location :
Singapore
Print_ISBN :
978-1-4244-5099-2
Electronic_ISBN :
978-1-4244-5100-5
Type :
conf
DOI :
10.1109/EPTC.2009.5416546
Filename :
5416546
Link To Document :
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