• DocumentCode
    3521561
  • Title

    Stability of the performance of thin film modules during one year of operation

  • Author

    Beyer, Hans Georg ; Yordanov, Georgi Hristov

  • Author_Institution
    Univ. of Agder (UiA), Grimstad, Norway
  • fYear
    2012
  • fDate
    3-8 June 2012
  • Abstract
    At the University of Agder in Grimstad, Southern Norway, a test bench for photovoltaic modules is in operation since December 2010. Currently, various c-Si as well as aSi, CIS and HIT modules are under investigation. This project is part of the Norwegian contribution to IEA PVPS Task13. The paper focuses on the stability of the modules´ MPP-performance in the course of one year. For this purpose, data on the DC response are logged together with irradiance and module temperature at one-minute intervals. Data analysis is performed in monthly blocks. The modeling involves two steps. First, the short-circuit current is expressed as function of irradiance and module temperature. Then, the MPP power is modeled as function of the short-circuit current and temperature. For c-Si and CIS technologies, a simple linear approach proved sufficient for the first step. For the aSi and HIT modules, the response of the short-circuit current has to take into account additional information on irradiance conditions - in this case the air mass (AM). The stability of the performance is analyzed by comparison of monthly parameter sets and the monthly stability of the model quality for a fixed parameter set. Whereas for the CIS and the HIT modules the model quality for the unique parameter set changes within the data uncertainty only, for the aSi module the variations are significant. The variability of the response characteristics in this case could be traced back to the first modeling step, giving short-circuit current as function of irradiance conditions.
  • Keywords
    amorphous semiconductors; elemental semiconductors; maximum power point trackers; short-circuit currents; silicon; solar cells; thin film devices; CIS module; DC response; HIT module; MPP; aSi; air mass; c-Si; data analysis; data uncertainty; irradiance; module temperature; photovoltaic module; short-circuit current; stability; thin film module; Adaptation models; Analytical models; Atmospheric modeling; Data models; Integrated circuit modeling; Stability analysis; Thermal stability; performance modeling; thin-film modules;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference (PVSC), 2012 38th IEEE
  • Conference_Location
    Austin, TX
  • ISSN
    0160-8371
  • Print_ISBN
    978-1-4673-0064-3
  • Type

    conf

  • DOI
    10.1109/PVSC.2012.6318079
  • Filename
    6318079