DocumentCode :
3521617
Title :
Comparison of the performance degradation between selective and homogeneous emitter solar cells under encapsulation and outdoor exposure
Author :
Liang, Zongcun ; Zeng, Fei ; Chen, Shuquan ; Shen, Hui
Author_Institution :
State Key Lab. of Optoelectron. Mater. & Technol., Sun Yat-Sen Univ., Guangzhou, China
fYear :
2012
fDate :
3-8 June 2012
Abstract :
In this paper, the comparison of performance degradation between selective emitter (SE) solar cell and traditional homogenous emitter (HE) solar cell under encapsulation and outdoor light exposure was investigated. One-cell small module experiments show that the performance degradation under encapsulation is mainly determined by the Jsc (short circuit current density) loss, which is calculated according to the EQE (external quantum efficiency) measurements for detail analyses, and SE one-cell module demonstrates a bigger Jsc loss than HE module does. The 72-cell SE modules present a similar power loss rate as the HE modules after encapsulation. After 360 days´ outdoor exposure, SE module demonstrates more power losses compared with HE module; nevertheless, SE PV module still has a larger maximum power than standard HE module.
Keywords :
reliability; solar cells; external quantum efficiency; homogeneous emitter solar cells; performance degradation; selective emitter solar cell; short circuit current density loss; time 360 day; Degradation; Encapsulation; Etching; Helium; Ink; Loss measurement; Photovoltaic cells; PV module; encapsulation; light induced degradation; performance degradation; quantum efficiency; selective emitter solar cell;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference (PVSC), 2012 38th IEEE
Conference_Location :
Austin, TX
ISSN :
0160-8371
Print_ISBN :
978-1-4673-0064-3
Type :
conf
DOI :
10.1109/PVSC.2012.6318081
Filename :
6318081
Link To Document :
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