• DocumentCode
    3521617
  • Title

    Comparison of the performance degradation between selective and homogeneous emitter solar cells under encapsulation and outdoor exposure

  • Author

    Liang, Zongcun ; Zeng, Fei ; Chen, Shuquan ; Shen, Hui

  • Author_Institution
    State Key Lab. of Optoelectron. Mater. & Technol., Sun Yat-Sen Univ., Guangzhou, China
  • fYear
    2012
  • fDate
    3-8 June 2012
  • Abstract
    In this paper, the comparison of performance degradation between selective emitter (SE) solar cell and traditional homogenous emitter (HE) solar cell under encapsulation and outdoor light exposure was investigated. One-cell small module experiments show that the performance degradation under encapsulation is mainly determined by the Jsc (short circuit current density) loss, which is calculated according to the EQE (external quantum efficiency) measurements for detail analyses, and SE one-cell module demonstrates a bigger Jsc loss than HE module does. The 72-cell SE modules present a similar power loss rate as the HE modules after encapsulation. After 360 days´ outdoor exposure, SE module demonstrates more power losses compared with HE module; nevertheless, SE PV module still has a larger maximum power than standard HE module.
  • Keywords
    reliability; solar cells; external quantum efficiency; homogeneous emitter solar cells; performance degradation; selective emitter solar cell; short circuit current density loss; time 360 day; Degradation; Encapsulation; Etching; Helium; Ink; Loss measurement; Photovoltaic cells; PV module; encapsulation; light induced degradation; performance degradation; quantum efficiency; selective emitter solar cell;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference (PVSC), 2012 38th IEEE
  • Conference_Location
    Austin, TX
  • ISSN
    0160-8371
  • Print_ISBN
    978-1-4673-0064-3
  • Type

    conf

  • DOI
    10.1109/PVSC.2012.6318081
  • Filename
    6318081