DocumentCode
3521617
Title
Comparison of the performance degradation between selective and homogeneous emitter solar cells under encapsulation and outdoor exposure
Author
Liang, Zongcun ; Zeng, Fei ; Chen, Shuquan ; Shen, Hui
Author_Institution
State Key Lab. of Optoelectron. Mater. & Technol., Sun Yat-Sen Univ., Guangzhou, China
fYear
2012
fDate
3-8 June 2012
Abstract
In this paper, the comparison of performance degradation between selective emitter (SE) solar cell and traditional homogenous emitter (HE) solar cell under encapsulation and outdoor light exposure was investigated. One-cell small module experiments show that the performance degradation under encapsulation is mainly determined by the Jsc (short circuit current density) loss, which is calculated according to the EQE (external quantum efficiency) measurements for detail analyses, and SE one-cell module demonstrates a bigger Jsc loss than HE module does. The 72-cell SE modules present a similar power loss rate as the HE modules after encapsulation. After 360 days´ outdoor exposure, SE module demonstrates more power losses compared with HE module; nevertheless, SE PV module still has a larger maximum power than standard HE module.
Keywords
reliability; solar cells; external quantum efficiency; homogeneous emitter solar cells; performance degradation; selective emitter solar cell; short circuit current density loss; time 360 day; Degradation; Encapsulation; Etching; Helium; Ink; Loss measurement; Photovoltaic cells; PV module; encapsulation; light induced degradation; performance degradation; quantum efficiency; selective emitter solar cell;
fLanguage
English
Publisher
ieee
Conference_Titel
Photovoltaic Specialists Conference (PVSC), 2012 38th IEEE
Conference_Location
Austin, TX
ISSN
0160-8371
Print_ISBN
978-1-4673-0064-3
Type
conf
DOI
10.1109/PVSC.2012.6318081
Filename
6318081
Link To Document