Title :
High-voltage bias testing of PV modules in the hot and humid climate without inducing irreversible instantaneous degradation
Author :
Dhere, Neelkanth ; Kaul, Ashwani ; Schneller, Eric ; Shiradkar, Narendra
Author_Institution :
Florida Solar Energy Center, Cocoa, FL, USA
Abstract :
High-voltage bias testing of PV modules is known to be useful for revealing design, material and process flaws in PV modules. It is accepted that the hot and humid climate under high-voltage bias imposes a severely harsh environment on the PV modules and enhances the possibility of degradation. Test location is, therefore, important. A test methodology is being presented here that can provide useful information for testing PV modules at high voltage in nature´s own laboratory in a relatively short time frame.
Keywords :
photovoltaic cells; photovoltaic power systems; PV modules; harsh environment; high-voltage bias testing; hot and humid climate; inducing irreversible instantaneous degradation; revealing design; Degradation; Glass; Humidity; Leakage current; Resistance; Testing; High-voltage bias testing; PV; c-Si; outdoor testing; reliability;
Conference_Titel :
Photovoltaic Specialists Conference (PVSC), 2012 38th IEEE
Conference_Location :
Austin, TX
Print_ISBN :
978-1-4673-0064-3
DOI :
10.1109/PVSC.2012.6318090