Title :
Method for system-level signal and power integrity modeling of high-speed electronic packages
Author :
Liu, En-Xiao ; Wei, Xingchang ; Oo, Zaw Zaw ; Zhang, Yao-Jiang ; Zhang, Wenzu ; Li, Er-Ping
Author_Institution :
Adv. Electromagn. & Electron. Lab., A*STAR Inst. of High Performance Comput., Singapore, Singapore
Abstract :
This paper reported the latest development of the modal decomposition with T-matrix method for accurate and efficient analysis of coupling of multiple vias in finite-sized multilayered parallel-plate structures. A novel boundary modeling method, named the frequency-dependent cylinder layer (FDCL), is proposed to resolve the open problem of boundary modeling associated with modal expansion methods. Moreover, a generalized T matrix model derived by the mode matching technique, is created to characterize the coupling effect for vias penetrating more than one layer in a multilayered structure. Both numerical and experimental verifications are presented to validate the new modeling methods. The above method has been incorporated into the simulation tool developed recently by us.
Keywords :
high-speed integrated circuits; integrated circuit modelling; matrix decomposition; modal analysis; multilayers; system-in-package; system-on-chip; T-matrix method; boundary modeling method; finite-sized multilayered parallel-plate structures; frequency-dependent cylinder layer; high-speed electronic packages; modal decomposition; modal expansion method; mode matching technique; multiple vias coupling; open problem; power integrity modeling; simulation tool; system-in-package; system-level signal; system-on-chip; Conductors; Electromagnetic coupling; Electromagnetic waveguides; Electronics packaging; High-speed electronics; Impedance; Integrated circuit packaging; Power system modeling; Power transmission lines; Transmission line theory;
Conference_Titel :
Electronics Packaging Technology Conference, 2009. EPTC '09. 11th
Conference_Location :
Singapore
Print_ISBN :
978-1-4244-5099-2
Electronic_ISBN :
978-1-4244-5100-5
DOI :
10.1109/EPTC.2009.5416566