DocumentCode :
3521978
Title :
Application of the latency insertion method to circuits with blackbox macromodel representation
Author :
Schutt-Ainè, Josè ; Klokotov, Dmitri ; Goh, Patrick ; Tan, Jilin ; Al-Hawari, F. ; Liu, Ping ; Dai, Wenliang
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Illinois at Urbana-Champaign, Urbana, IL, USA
fYear :
2009
fDate :
9-11 Dec. 2009
Firstpage :
92
Lastpage :
95
Abstract :
In this work the latency insertion method (LIM) is applied to the treatment of blackbox networks described by their frequency-domain scattering parameters. The method allows the simulation of passive macromodels in the LIM environment. This generalization allows LIM to simulate subnetworks with frequency-dependent parameters describing phenomena such as skin effect and substrate loss. The derivation of the algorithms is presented as well as simulation results to validate the method.
Keywords :
S-parameters; integrated circuit modelling; network analysis; skin effect; blackbox macromodel representation; circuit analysis; frequency-dependent parameters; frequency-domain scattering parameters; latency insertion method; passive macromodels; skin effect; substrate loss; Circuit analysis; Circuit simulation; Computational modeling; Delay; Equations; Frequency; Integrated circuit interconnections; SPICE; Scattering parameters; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics Packaging Technology Conference, 2009. EPTC '09. 11th
Conference_Location :
Singapore
Print_ISBN :
978-1-4244-5099-2
Electronic_ISBN :
978-1-4244-5100-5
Type :
conf
DOI :
10.1109/EPTC.2009.5416569
Filename :
5416569
Link To Document :
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