• DocumentCode
    3522270
  • Title

    Growth and p-type doping of cuprous oxide thin-films for photovoltaic applications

  • Author

    Lee, Yun Seog ; Winkler, Mark T. ; Siah, Sin Cheng ; Brandt, Riley ; Buonassisi, Tonio

  • Author_Institution
    Massachusetts Inst. of Technol., Cambridge, MA, USA
  • fYear
    2012
  • fDate
    3-8 June 2012
  • Abstract
    Cuprous oxide is considered a promising earth-abundant semiconductor material for low-cost photovoltaic applications. In this contribution, we report growth of high-quality Cu2O crystalline thin-films and p-type doping induced by nitrogen. We present an effective p-type doping method for Cu2O thin-films by introducing nitrogen gas as a dopant during a reactive sputtering process. Electrical and optical properties of the resulting films are controlled by varying deposition parameters such as nitrogen partial pressure. We successfully reduce the electrical resistivity of the Cu2O thin-films down to 5.1 Ω·cm and increase hole density to 1.8×1018 cm-3. Nitrogen-doped Cu2O films show higher absorption of low-energy photons while all films exhibit an optical bandgap between 1.9 and 2.0 eV.
  • Keywords
    copper compounds; electrical resistivity; energy gap; light absorption; nitrogen; semiconductor doping; semiconductor growth; semiconductor thin films; solar cells; sputter deposition; thin film devices; Cu2O:N; cuprous oxide thin-films; earth-abundant semiconductor material; electrical property; electrical resistivity; electron volt energy 1.9 eV; electron volt energy 2.0 eV; high-quality crystalline thin-films; hole density; low-cost photovoltaic applications; low-energy photon absorption; nitrogen partial pressure; optical band gap; optical property; p-type doping; reactive sputtering process; Absorption; Heating; Nitrogen; Optical films; Substrates; Cu2O; copper compounds; cuprous oxide; doping; semiconductor films; semiconductor growth; thin films;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference (PVSC), 2012 38th IEEE
  • Conference_Location
    Austin, TX
  • ISSN
    0160-8371
  • Print_ISBN
    978-1-4673-0064-3
  • Type

    conf

  • DOI
    10.1109/PVSC.2012.6318116
  • Filename
    6318116