• DocumentCode
    3522378
  • Title

    Equivalent deflection angle of textured surfaces

  • Author

    Nagel, James R. ; Scarpulla, Michael A.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Utah, Salt Lake City, UT, USA
  • fYear
    2012
  • fDate
    3-8 June 2012
  • Abstract
    The concept of optical path length enhancement is a useful tool for characterizing the effects of light trapping in thin films by providing a convenient geometrical interpretation of energy absorption. However, path length calculations cannot distinguish between absorption gains due to better antireflection versus absorption gains due to actual scattering of incident rays. We therefore introduce a similar metric of equivalent deflection angle to describe the effective scattering of light by a textured surface. This new concept provides useful information about light trapping that path length alone cannot. The paper begins with the geometrical interpretation of the metric and then demonstrates the insights derived from light scattering by a simple textured surface.
  • Keywords
    light scattering; solar cells; sunlight; surface texture; energy absorption gain; equivalent deflection angle; geometrical interpretation; incident rays scattering; light scattering; light trapping; optical path length enhancement; simple textured surface; thin films; Absorption; Charge carrier processes; Optical surface waves; Photovoltaic cells; Scattering; Silicon; Surface texture; light trapping; photovoltaic cells; silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference (PVSC), 2012 38th IEEE
  • Conference_Location
    Austin, TX
  • ISSN
    0160-8371
  • Print_ISBN
    978-1-4673-0064-3
  • Type

    conf

  • DOI
    10.1109/PVSC.2012.6318121
  • Filename
    6318121