• DocumentCode
    3522447
  • Title

    Single-crystalline-like germanium thin films on glass substrates

  • Author

    Selvamanickam, Venkat ; Jian, C. ; Xiong, X. ; Majkic, G. ; Galtsyan, E.

  • Author_Institution
    Dept. of Mech. Eng. & Texas Center for Supercond., Univ. of Houston, Houston, TX, USA
  • fYear
    2012
  • fDate
    3-8 June 2012
  • Abstract
    Single-crystalline-like germanium films have been demonstrated on inexpensive glass substrates (quartz). Ion Beam Assisted Deposition (IBAD) was employed to achieve biaxial crystallographic texture in MgO deposited on quartz substrates. Using intervening epitaxial oxide buffer layers, single-crystalline-like germanium films have been grown by magnetron sputtering. In-spite of significant lattice mismatch and structural mismatch, epitaxial growth was achieved in all layers. All thin films in this work were deposited by reel-to-reel processing. In-plane texture better than 5° has been measured in the germanium film. A Hall mobility value of 107 cm2/Vs was attained in 400 nm thick germanium films on glass substrates.
  • Keywords
    glass; semiconductor thin films; solar cells; sputter deposition; thin films; Ge; IBAD; MgO; biaxial crystallographic texture; glass substrates; in-plane texture; intervening epitaxial oxide buffer layers; ion beam assisted deposition; lattice mismatch; magnetron sputtering; quartz substrates; reel-to-reel processing; single-crystalline-like germanium films; single-crystalline-like germanium thin films; structural mismatch; Indexes; Milling; Molecular beam epitaxial growth; RNA; epitaxy; germanium; glass; mobility; quartz;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference (PVSC), 2012 38th IEEE
  • Conference_Location
    Austin, TX
  • ISSN
    0160-8371
  • Print_ISBN
    978-1-4673-0064-3
  • Type

    conf

  • DOI
    10.1109/PVSC.2012.6318125
  • Filename
    6318125