Title :
Development of spot size monitor using laser interferometry
Author :
Hayakawa, A. ; Ozaki, Y. ; Nakabayashi, S. ; Yasuda, K. ; Ohashi, M. ; Shintake, T.
Keywords :
Colliding beam devices; Electron beams; Interference; Interferometry; Laser beams; Laser excitation; Monitoring; Optical pulse generation; Size measurement; Testing;
Conference_Titel :
Lasers and Electro-Optics, 1995. Technical Digest. CLEO/Pacific Rim'95., Pacific Rim Conference on
Conference_Location :
Chiba, Japan
Print_ISBN :
0-7803-2400-5
DOI :
10.1109/CLEOPR.1995.527077