DocumentCode
3522690
Title
Power supply analysis in package and SiP design
Author
Dai, Wenliang
Author_Institution
Cadence Design Syst., Inc., Shanghai, China
fYear
2009
fDate
10-13 Aug. 2009
Firstpage
175
Lastpage
178
Abstract
This paper introduces a process that allows customers to do package power integrity (PI) analysis on the package side. The chip information such as the die circuits and current profiles as well as power delivery network circuit can be used at the board level to perform PI analysis. The die current profiles are used to obtain the target impedance. For the complicated package geometry structure, the 3D electromagnetic field solver is used to extract the package power supply model. In order to meet the target impedance, the required decoupling capacitors and location can be analyzed and placed according to the transfer impedance in frequency domain. The user can use the voltage ripples in time domain on power and ground nets for a direct verification process.
Keywords
network analysis; power supply circuits; system-in-package; 3D electromagnetic field solver; chip information; current profiles; die circuits; package power integrity; power supply analysis; system-in-package; Circuits; Electromagnetic fields; Electromagnetic modeling; Geometry; Impedance; Information analysis; Packaging; Performance analysis; Power supplies; Solid modeling;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Packaging Technology & High Density Packaging, 2009. ICEPT-HDP '09. International Conference on
Conference_Location
Beijing
Print_ISBN
978-1-4244-4658-2
Electronic_ISBN
978-1-4244-4659-9
Type
conf
DOI
10.1109/ICEPT.2009.5270770
Filename
5270770
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