DocumentCode :
3522960
Title :
The influence of SO2 environments on immersion silver finished PCBs by mixed flow gas testing
Author :
Zhang, Shunong ; Shrivastava, Anshul ; Osterman, Michael ; Pecht, Michael ; Kang, Rui
Author_Institution :
Dept. of Syst. Eng. of Eng. Technol., Beijing Univ. of Aeronaut. & Astronaut., Beijing, China
fYear :
2009
fDate :
10-13 Aug. 2009
Firstpage :
116
Lastpage :
122
Abstract :
This study focuses on the corrosion of immersion silver (ImAg) finished copper land patterns on printed circuit boards (PCBs) due to SO2 exposure in a mixed flow gas chamber. Six test conditions were examined with varying concentrations, temperatures, relative humidity, and exposure times. The results indicated that there are two mechanisms of corrosion on ImAg-finished PCBs in an SO2 gas environment: direct chemical corrosion and electrode reaction. No evidence shows that Ag2S and Cu2S or CuS were produced. In high humidity, chemical and electrode reaction both existed, and the corrosion products could included Ag2O, AgCl, Ag2SO3, CuO, CuCl2 and CuCl, In low humidity, the chemical corrosion was predominant, and the corrosion products could include Ag2O, CuO. Passive films were formed on ImAg finished surface under long exposure time. The temperature from 30degC to 40degC did not have an obvious influence on the ImAg-finished PCBs.
Keywords :
corrosion; printed circuits; silver; ImAg-finished PCB; SO2 exposure; SO2 gas environments; chemical reaction; copper land patterns; corrosion products; direct chemical corrosion; electrode reaction; exposure times; immersion silver finished PCB; mixed flow gas chamber; mixed flow gas testing; passive films; printed circuit boards; relative humidity; temperature 30 C to 40 C; Chemical products; Circuit testing; Copper; Corrosion; Electrodes; Humidity; Land surface temperature; Printed circuits; Silver; Surface finishing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Packaging Technology & High Density Packaging, 2009. ICEPT-HDP '09. International Conference on
Conference_Location :
Beijing
Print_ISBN :
978-1-4244-4658-2
Electronic_ISBN :
978-1-4244-4659-9
Type :
conf
DOI :
10.1109/ICEPT.2009.5270782
Filename :
5270782
Link To Document :
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