• DocumentCode
    3523409
  • Title

    Experiences with continuous on-stream XRD at the Ash Grove Leamington plant

  • Author

    Summit, Don ; Crutchfield, G. Duane ; Godek, A.I. ; Manias, Con ; Storer, Peter

  • fYear
    2003
  • fDate
    4-9 May 2003
  • Firstpage
    319
  • Lastpage
    332
  • Abstract
    An on-stream X-ray diffraction analyzer has been monitoring the finished cement at the Ash Grove Leamington plant since October 2001. The complete mineralogical composition of the cement is provided by continuous analysis of cement extracted from the product conveyor with results presented as trends. The analyzer has been operating well, showing consistent agreement with traditional forms of analysis such as XRF and free lime titration. Trends of the XRD analysis have been used to identify contamination of the gypsum additive, and variation of the gypsum hydration states can be clearly seen. The XRD analysis has been used to control the rate of gypsum addition to the finish mill, starting from mid-2002. Further control loops are expected as relationships between mineralogy, strength and setting times evolve, The continuous XRD has provided plant personnel with a dynamic real time trend window into the quality of their cement production process.
  • Keywords
    X-ray diffraction; cement industry; chemical variables control; monitoring; process control; solvation; Ash Grove Leamington plant; X-ray diffraction analyzer; XRF; cement production process; continuous analysis; continuous on-stream XRD; control loops; dynamic real time trend window; finish mill; finished cement monitoring; free lime titration; gypsum addition rate control; gypsum additive; gypsum hydration states; mineralogical composition; mineralogy; product conveyor; Artificial intelligence; Ash; Continuous production; Instruments; Milling machines; Monitoring; Quality control; Raw materials; X-ray diffraction; X-ray scattering;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Cement Industry Technical Conference, 2003. Conference Record. IEEE-IAS/PCA 2003
  • ISSN
    1079-9931
  • Print_ISBN
    0-7803-7900-4
  • Type

    conf

  • DOI
    10.1109/CITCON.2003.1204733
  • Filename
    1204733