DocumentCode
3523790
Title
Dielectric response measurements utilizing non-sinusoidal waveforms
Author
Sonerud, B. ; Bengtsson, T. ; Blennow, J. ; Gubanski, S.M.
Author_Institution
Chalmers Univ. of Technol., Gothenburg
fYear
2006
fDate
15-18 Oct. 2006
Firstpage
43
Lastpage
46
Abstract
In order to assess the effect non-sinusoidal high voltages impose on electrical insulation systems, new methods for material characterization and diagnostics are needed. The method developed in the work presented here utilizes arbitrary non-sinusoidal voltage waveforms. It thereafter makes use of the fast Fourier transform (FFT) analyses for extracting the harmonic contents of the applied voltages and the resulting currents. In this way the response spectrum for the harmonic frequencies is obtained. The method puts high demands on the measurement instrumentation as well as on the calibration and correction procedures for obtaining reliable results. One of the main advantages with the measurement system developed is that it does not require a precise and well controlled voltage source. This provides new possibilities for on-line monitoring and diagnostics, when any voltage appearing in the system can be utilized. It is shown that measurement results obtained by the new method are in good agreement with results obtained by means of the conventional frequency response techniques.
Keywords
electric breakdown; electric strength; fast Fourier transforms; insulation; power electronics; waveform analysis; applied voltages; calibration; controlled voltage source; diagnostics; dielectric response measurement; electrical insulation system; fast Fourier transform analysis; harmonic frequency; measurement correction; nonsinusoidal voltage waveform; on-line monitoring; Calibration; Control systems; Dielectric materials; Dielectric measurements; Dielectrics and electrical insulation; Fast Fourier transforms; Frequency; Harmonic analysis; Instruments; Voltage control;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Insulation and Dielectric Phenomena, 2006 IEEE Conference on
Conference_Location
Kansas City, MO
Print_ISBN
1-4244-0547-5
Electronic_ISBN
1-4244-0547-5
Type
conf
DOI
10.1109/CEIDP.2006.312058
Filename
4105366
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