DocumentCode :
3523817
Title :
Towards heterogeneous microsystems design-for-test in a graduate student environment
Author :
Stokes, Peter A. ; Mallard, Robert E.
Author_Institution :
CMC Microsyst., Kingston, ON, Canada
fYear :
2009
fDate :
25-27 July 2009
Firstpage :
81
Lastpage :
84
Abstract :
Advances in the microfabrication of heterogeneous microsystems is enabling increasingly complex devices. Modeling, simulation and test methodologies are unable to keep pace. Custom test solutions require significant resources to implement and are often not reusable. Devices not performing as expected are difficult to diagnose. Design-for-testability techniques familiar to silicon microelectronics designers may offer solutions for validating and debugging designs. What is desirable is a system design and operational algorithm optimization in a rapid prototyping environment that incorporates design for testability considerations. The university research setting is particularly well suited for developing such an environment. In this paper, we review some of the generic tests performed on microsystems-based sensor systems by graduate students. Taking a research infrastructure perspective, we then propose improvements to proof of concept environments in universities to facilitate addition of design-for-test features into heterogeneous microsystems.
Keywords :
microfabrication; microsensors; generic test; graduate student environment; heterogeneous microsystem design-for-test; microfabrication; microsystem-based sensor system; Application software; Design for testability; Design methodology; Design optimization; Fabrication; Manufacturing; Microfluidics; Prototypes; Software prototyping; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microelectronic Systems Education, 2009. MSE '09. IEEE International Conference on
Conference_Location :
San Francisco, CA
Print_ISBN :
978-1-4244-4407-6
Electronic_ISBN :
978-1-4244-4406-9
Type :
conf
DOI :
10.1109/MSE.2009.5270823
Filename :
5270823
Link To Document :
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