DocumentCode
3524235
Title
Characterization of a quantum dot nipi photovoltaic device
Author
Slocum, Michael A. ; Forbes, David V. ; Roland, Paul ; Ellingson, Randall ; Hubbard, Seth M.
Author_Institution
Rochester Inst. of Technol., Rochester, NY, USA
fYear
2012
fDate
3-8 June 2012
Abstract
Quantum dot nipi test structures consisting of n-type / intrinsic / p-type / intrinsic layers have been developed to probe the effects of placing quantum dots within a doping superlattice. Coupling between the doping superlattice states and quantum dots that can be grown within the superlattice results in increases in carrier lifetimes within the quantum dots, and modifies the absorption spectrum. With the addition of dots within a nipi device, the benefits have been quantified by measuring absorption, activation energy, photoluminescence, and lifetime. By characterizing the modified quantum dot properties, it is hopeful that this will demonstrate the potential of the nipi structure as an intermediate band solar cell candidate.
Keywords
quantum dots; solar cells; absorption measurement; absorption spectrum; activation energy measurement; carrier lifetimes; doping superlattice states; intermediate band solar cell candidate; lifetime measurement; photoluminescence measurement; quantum dot nipi photovoltaic device characterization; quantum dot nipi test structures; quantum dot properties; confinement; doping superlattice; nipi; quantum dot;
fLanguage
English
Publisher
ieee
Conference_Titel
Photovoltaic Specialists Conference (PVSC), 2012 38th IEEE
Conference_Location
Austin, TX
ISSN
0160-8371
Print_ISBN
978-1-4673-0064-3
Type
conf
DOI
10.1109/PVSC.2012.6318208
Filename
6318208
Link To Document