Title :
How to characterize intense femtosecond lasers pulses by cross-phase modulation
Author :
Ripoche, J.-F. ; Lange, R. ; Franco, M.A. ; Prade, B.S. ; Mysyrowicz, A.
Author_Institution :
Lab. d´Opt. Appliquee, ENSTA-Ecole Polytech., Palaiseau, France
Abstract :
Summary form only given. With the rapid progress in femtosecond laser technology, the accurate measurement of pulse time profile becomes a more and more important issue. Several diagnostics techniques have been demonstrated, which go beyond the 2/spl omega/ autocorrelation method. We show in this presentation that methods based on spectrally resolved cross-phase modulation (XPM) provide a powerful and simple tool for femtosecond pulses analysis. Two distinct physical processes are exploited: multiphoton ionization (MPI) in a neutral gas or instantaneous optical Kerr effect (OKE) in a transparent solid.
Keywords :
high-speed optical techniques; laser variables measurement; multiphoton processes; optical Kerr effect; optical modulation; phase modulation; photoionisation; cross-phase modulation; intense femtosecond laser pulse diagnostics; multiphoton ionization; optical Kerr effect; spectral resolution; time profile measurement; Autocorrelation; Ionization; Kerr effect; Nonlinear optics; Optical modulation; Optical pulses; Pulse measurements; Pulse modulation; Time measurement; Ultrafast optics;
Conference_Titel :
Lasers and Electro-Optics, 1998. CLEO 98. Technical Digest. Summaries of papers presented at the Conference on
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
1-55752-339-0
DOI :
10.1109/CLEO.1998.676003
