DocumentCode :
3524522
Title :
Contact resistance comparison of good and bad crimp joints with tinned wires under thermal shock
Author :
Liu, D. ; Bracket, Tom ; McCarthy, Shaun
Author_Institution :
Sci. Res. Lab., Ford Motor Co., Dearborn, MI, USA
fYear :
2001
fDate :
2001
Firstpage :
35
Lastpage :
43
Abstract :
#16 wire gauge crimp joints of good quality were made tinned wires in the conventional way. Some of them then subjected to twisting in gap between the two wings. All of them were heat-soaked at 135°C for 300 hours. They were then into a thermal-shock furnace for thermal cycling from -40°C to 125°C, each cycle lasting one hour for a total of 570hours. The four-leads method was used to measure the contact resistance for every cycle under the dry circuit condition. The contact resistance of good crimps generally increased at a slower pace over time than the bad ones. The resistance of some good and bad crimps would tend to more or less off after 100-200 cycles while others would continue to increase their resistance without leveling off and some of them might show a sudden jump. Nevertheless, the measured resistance history showed that a crimp with a tinned wire exhibited accepted performance whether it was good or not so good a crimp. The results also showed that the temperature history would effect the contact resistance measured at a later time. For example, the resistance of a crimp at 125°C would be somehow different depending on weather the previous temperature started from -40°C or from -17°C. Data analysis showed that even with severe thermal shocks for 570 hours and possible consequence of repeated shearing, the contact in the crimp was still essentially a metallic one
Keywords :
contact resistance; electric connectors; electrical contacts; surface treatment; thermal shock; thermal stresses; -17 C; -40 to 125 C; 135 C; 300 hr; 570 hr; bad crimps; contact resistance; crimp joint quality; crimp joints; crimp resistance; dry circuit condition; four-leads method; good crimps; heat-soaking; metallic crimp contact; resistance history; severe thermal shocks; shearing; temperature history; thermal cycling; thermal shock; thermal shock furnace; tinned wires; twisting; wire gauge; Circuits; Contact resistance; Data analysis; Electric shock; Electrical resistance measurement; Furnaces; History; Temperature dependence; Time measurement; Wire;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Contacts, 2001. Proceedings of the Forty-Seventh IEEE Holm Conference on
Conference_Location :
Montreal, Que.
Print_ISBN :
0-7803-6667-0
Type :
conf
DOI :
10.1109/HOLM.2001.953187
Filename :
953187
Link To Document :
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