• DocumentCode
    3524648
  • Title

    A Linear Model for the Differences of Breakdown Voltages in IEC 60052 Tables

  • Author

    Chatpattananan, V. ; Pattanadech, N.

  • Author_Institution
    Fac. of Eng., King Mongkut´´s Inst. of Technol. Ladkrabang, Bangkok
  • fYear
    2006
  • fDate
    15-18 Oct. 2006
  • Firstpage
    249
  • Lastpage
    252
  • Abstract
    IEC 60052 table 2 and table 3 provides the values of breakdown voltage for sphere gap occurred from different values of gap diameter and gap spacing. This document investigates the breakdown voltages from IEC 60052 table 2 and IEC 60052 table 3 under the same values of sphere gap diameter and gap spacing. The result shows that, provided the same condition of sphere gap diameter and gap spacing, the breakdown voltage value from table 3 (positive impulse) is higher than the breakdown voltage value from table 2 (negative impulse). Also, the relationship between the difference in breakdown voltage with diameter and spacing is simply a linear model in which a least square regression that minimizes sum of square errors can be used to find the relationship. With least square approach, a linear regression equation without an intercept term, or linear regression through the origin, is better accurate than the linear regression with an intercept term. The difference in breakdown voltage also reveals an incongruity in a step function pattern in the data in which an adjustment in removal of some data points was made to propose another regression through the origin equation the explain the difference in breakdown voltage to gap diameter and gap spacing.
  • Keywords
    IEC standards; electric breakdown; least squares approximations; regression analysis; IEC 60052 tables; breakdown voltages; least square regression; linear regression equation; sphere gap diameter; sphere gap spacing; step function pattern; Breakdown voltage; Dielectrics and electrical insulation; Difference equations; Frequency; IEC standards; Impulse testing; Least squares methods; Lightning; Linear regression; Pulse measurements;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation and Dielectric Phenomena, 2006 IEEE Conference on
  • Conference_Location
    Kansas City, MO
  • Print_ISBN
    1-4244-0546-7
  • Electronic_ISBN
    1-4244-0547-5
  • Type

    conf

  • DOI
    10.1109/CEIDP.2006.312108
  • Filename
    4105416