DocumentCode
3524678
Title
A fundamental experiment on operating characteristics of Ag, Pd and Cu contacts in inert atmosphere
Author
Makimoto, Jiro ; Sawa, Koichiro ; Hasegawa, Makoto
Author_Institution
Dept. of Syst. Design Eng., Keio Univ., Yokohama, Japan
fYear
2001
fDate
2001
Firstpage
98
Lastpage
103
Abstract
The purpose of this work is to research the effects of the surrounding atmosphere of contacts on arc discharge and contact reliability in various aspects, and in future, to construct a systematic physical theory for various phenomena in gases, especially in inert gases. By filling the contact part with inert gas, prevention of increase in contact resistance is expected. This paper examines the operational performances of three typical contact materials, Ag, Pd and Cu, in a DC inductive (20 mH) load circuit with load current up to 3.0 A in air and in nitrogen gas. As a result, it is shown that in nitrogen atmosphere, contact resistance is lower and more stable and material wear and transfer is smaller than in air. Thus nitrogen gas has the effect of delaying and restraining deterioration of contact reliability. These consequences are considered to come from the difference of morphology and products on the contact surface, and moreover, the difference of arc duration and arc discharge phase
Keywords
circuit-breaking arcs; contact resistance; copper; electrical contacts; nitrogen; palladium; reliability; silver; stability; 3 A; Ag; Ag contacts; Cu; Cu contacts; DC inductive load circuit; N2; Pd; Pd contacts; air atmosphere; arc discharge; arc discharge phase; arc duration; contact atmosphere; contact materials; contact reliability; contact reliability deterioration; contact resistance; contact resistance stability; contact surface morphology; contact surface products; inert atmosphere; inert gas filled contact; inert gases; load current; material transfer; material wear; nitrogen atmosphere; nitrogen gas; operating characteristics; operational performance; systematic physical theory; Arc discharges; Atmosphere; Circuits; Contact resistance; Delay effects; Filling; Gases; Nitrogen; Partial discharges; Reliability theory;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Contacts, 2001. Proceedings of the Forty-Seventh IEEE Holm Conference on
Conference_Location
Montreal, Que.
Print_ISBN
0-7803-6667-0
Type
conf
DOI
10.1109/HOLM.2001.953196
Filename
953196
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