DocumentCode :
3524876
Title :
A range muon tomography performance study
Author :
Cuéllar, Leticia ; Borozdin, Konstantin N. ; Chung, Kiwhan ; Green, J. Andrew ; Hengartner, Nicolas W. ; Morris, Christopher ; Schultz, Larry J. ; Reimus, Nathaniel P. ; Roybal, Jonathan ; Bacon, Jeffrey D. ; Vogan-McNeil, Wendy
Author_Institution :
Los Alamos Nat. Lab., Los Alamos, NM, USA
fYear :
2010
fDate :
Oct. 30 2010-Nov. 6 2010
Firstpage :
67
Lastpage :
69
Abstract :
Soft cosmic ray tomography has been shown to successfully discriminate materials with various density levels due to their ability to deeply penetrate matter, allowing sensitivity to atomic number, radiation length and density. Because the multiple muon scattering signal from high Z-materials is very strong, the technology is well suited to the detection of the illicit transportation of special and radiololgical nuclear materials. In addition, a recent detection technique based on measuring the lower energy particles that do not traverse the material (range radiography), allows to discriminate low and medium Z-materials. We have demonstrated it first using Monte Carlo simulations. More recently, using a Mini-Muon Tracker developed at Los Alamos National Laboratory, we performed various experiments to try out the radiation length technology. This paper presents the results from real experiments and evaluates the likelihood that soft cosmic ray tomography may be applied to detect high-explosives.
Keywords :
Monte Carlo methods; cosmic ray muons; muon detection; nuclear explosions; tomography; Monte Carlo simulation; atomic number; high-explosive detection; low energy particle measurement; mini-muon tracker technique; multiple scattering signal; radiation density; radiation length technology; radiololgical nuclear materials; range muon tomography; soft cosmic ray tomography; Image reconstruction; Lead; Materials; Mesons; Scattering; Tomography; materials; muon; nuclear; tomography;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium Conference Record (NSS/MIC), 2010 IEEE
Conference_Location :
Knoxville, TN
ISSN :
1095-7863
Print_ISBN :
978-1-4244-9106-3
Type :
conf
DOI :
10.1109/NSSMIC.2010.5873718
Filename :
5873718
Link To Document :
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