Title :
Atomic parameters for Monte Carlo transport simulation: Survey, validation and induced systematic effects
Author :
Seo, H. ; Pia, M.G. ; Quintieri, L. ; Begalli, M. ; Saracco, P. ; Kim, C.H.
Author_Institution :
Dept. of Nucl. Eng., Hanyang Univ., Seoul, South Korea
fDate :
Oct. 30 2010-Nov. 6 2010
Abstract :
A wide survey has been performed, concerning atomic binding energies and ionization energies used by well-known general purpose Monte Carlo codes and a few specialized electromagnetic models for track structure simulation. Validation results are reported.
Keywords :
Monte Carlo methods; binding energy; ionisation; Monte Carlo transport simulation; atomic binding energy; atomic parameter; electromagnetic model; ionization energy; track structure simulation; Accuracy; Atomic measurements; Ionization; Libraries; Monte Carlo methods; NIST; Physics;
Conference_Titel :
Nuclear Science Symposium Conference Record (NSS/MIC), 2010 IEEE
Conference_Location :
Knoxville, TN
Print_ISBN :
978-1-4244-9106-3
DOI :
10.1109/NSSMIC.2010.5873722
