Title :
Studies of TiO2 Breakdown Under Pulsed Conditions
Author :
Zhao, G. ; Joshi, R.P. ; Lakdawala, V.K. ; Schamiloglu, E. ; Hjalmarson, H.
Author_Institution :
Dept. of Electr. & Comput. Eng., Old Dominion Univ., Norfolk, VA
Abstract :
Model studies of current conduction and breakdown in TiO2 were carried out. Our simulation results indicate that electrical breakdown of TiO2 under multiple pulsed conditions can occur at lower voltages as compared to quasi-DC biasing. This is in agreement with experimental data. The results are indicative of a cumulative effect. We hypothesize that the lower breakdown voltages observed in TiO2 under pulsed conditions, is a direct rise-time effect, coupled with cummulative detrapping.
Keywords :
ceramic insulation; electric breakdown; titanium compounds; TiO2; breakdown voltage; ceramic dielectrics; cummulative detrapping; current conduction; electric breakdown; multiple pulsed conditions; quasi-DC biasing; rise-time effect; Breakdown voltage; Ceramics; Dielectric breakdown; Dielectric materials; Dielectrics and electrical insulation; Electric breakdown; Electron traps; Energy storage; Pulse power systems; Testing;
Conference_Titel :
Electrical Insulation and Dielectric Phenomena, 2006 IEEE Conference on
Conference_Location :
Kansas City, MO
Print_ISBN :
1-4244-0546-7
Electronic_ISBN :
1-4244-0547-5
DOI :
10.1109/CEIDP.2006.311941
