• DocumentCode
    3525123
  • Title

    Studies of TiO2 Breakdown Under Pulsed Conditions

  • Author

    Zhao, G. ; Joshi, R.P. ; Lakdawala, V.K. ; Schamiloglu, E. ; Hjalmarson, H.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Old Dominion Univ., Norfolk, VA
  • fYear
    2006
  • fDate
    15-18 Oct. 2006
  • Firstpage
    349
  • Lastpage
    352
  • Abstract
    Model studies of current conduction and breakdown in TiO2 were carried out. Our simulation results indicate that electrical breakdown of TiO2 under multiple pulsed conditions can occur at lower voltages as compared to quasi-DC biasing. This is in agreement with experimental data. The results are indicative of a cumulative effect. We hypothesize that the lower breakdown voltages observed in TiO2 under pulsed conditions, is a direct rise-time effect, coupled with cummulative detrapping.
  • Keywords
    ceramic insulation; electric breakdown; titanium compounds; TiO2; breakdown voltage; ceramic dielectrics; cummulative detrapping; current conduction; electric breakdown; multiple pulsed conditions; quasi-DC biasing; rise-time effect; Breakdown voltage; Ceramics; Dielectric breakdown; Dielectric materials; Dielectrics and electrical insulation; Electric breakdown; Electron traps; Energy storage; Pulse power systems; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation and Dielectric Phenomena, 2006 IEEE Conference on
  • Conference_Location
    Kansas City, MO
  • Print_ISBN
    1-4244-0546-7
  • Electronic_ISBN
    1-4244-0547-5
  • Type

    conf

  • DOI
    10.1109/CEIDP.2006.311941
  • Filename
    4105442
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3525123