DocumentCode
3525344
Title
Small-signal measurement of laser diode chips
Author
Liu, Yu ; Zhu, Ning Hua ; Pun, Edwin Y B ; Chung, P.S.
Author_Institution
Inst. of Semicond., Acad. Sinica, Beijing, China
Volume
2
fYear
1999
fDate
18-22 Oct. 1999
Firstpage
1413
Abstract
Presents an accurate technique for measuring the input reflection coefficient and the frequency response of semiconductor laser diode chips. The effects of packaging parasitics and test probes can be completely removed in the measurement.
Keywords
calibration; frequency response; laser beams; laser variables measurement; light reflection; semiconductor device packaging; semiconductor lasers; frequency response; input reflection coefficient; laser diode chips; packaging parasitics; semiconductor laser diode chips; small-signal measurement; test probes; Bonding; Diode lasers; Electrical resistance measurement; Fixtures; Impedance measurement; Optical reflection; Probes; Semiconductor device measurement; Testing; Wire;
fLanguage
English
Publisher
ieee
Conference_Titel
Communications, 1999. APCC/OECC '99. Fifth Asia-Pacific Conference on ... and Fourth Optoelectronics and Communications Conference
Conference_Location
Beijing, China
Print_ISBN
7-5635-0402-8
Type
conf
DOI
10.1109/APCC.1999.820537
Filename
820537
Link To Document