DocumentCode :
3525366
Title :
High-resolution local current measurement of CdTe solar cells
Author :
Yoon, Heayoung P. ; Ruzmetov, Dmitry ; Haney, Paul M. ; Leite, Marina S. ; Hamadani, Behrang H. ; Talin, A. Alec ; Zhitenev, Nikolai B.
Author_Institution :
Center for Nanoscale Sci. & Technol., Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA
fYear :
2012
fDate :
3-8 June 2012
Abstract :
We investigate local electronic properties of CdTe solar cells using electron beam to excite electron-hole pairs and evaluate spatially resolved photocurrent characteristics. Standard semiconductor processes were used to fabricate Ohmic metal contacts on the surface of p-type CdTe / n-type CdS device extracted from a commercial solar panel. An ion milling process was used to prepare cross-sections of the devices. Local injection of carriers was controlled by an acceleration voltage of electron beam (1 kV to 30 kV) in a scanning electron microscope, and the results were correlated with the local morphology, microstructure, and chemical composition of the devices.
Keywords :
II-VI semiconductors; cadmium compounds; electric current measurement; scanning electron microscopy; solar cells; CdTe; carrier local injection; chemical composition; commercial solar panel; electron beam acceleration voltage; electron-hole pairs; high-resolution local current measurement; ion milling process; local electronic properties; local morphology; microstructure; n-type device; ohmic metal contact fabrication; p-type device; scanning electron microscope; solar cells; spatially resolved photocurrent characteristics; standard semiconductor processes; voltage 1 kV to 30 kV; Materials; Metals; CdTe; EBIC; cross section; electron beam induced current; focused ion beam; grain boundary; solar cells; thin film;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference (PVSC), 2012 38th IEEE
Conference_Location :
Austin, TX
ISSN :
0160-8371
Print_ISBN :
978-1-4673-0064-3
Type :
conf
DOI :
10.1109/PVSC.2012.6318262
Filename :
6318262
Link To Document :
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