DocumentCode :
3525443
Title :
19% efficiency heterojunction solar cells on Cz wafers from non-blended Upgraded Metallurgical Silicon
Author :
Einhaus, Roland ; Kraiem, Jed ; Degoulange, Julien ; Nichiporuk, O. ; Forster, Michael ; Papet, P. ; Andrault, Y. ; Grosset-Bourbange, D. ; Cocco, F.
Author_Institution :
Apollon Solar, Lyon, France
fYear :
2012
fDate :
3-8 June 2012
Abstract :
Highly purified n-type UMG (“Upgraded Metallurgical”) Silicon is a material with a strong potential for high efficiency low cost solar cells. Compared to p-type Silicon, n-type Silicon is in general less susceptible to lifetime degradation due to residual metal impurities or to light induced degradation due to the Boron-Oxygen complex. In this work a 15kg 6 inch mono-c Cz Silicon ingot has been grown from 100% highly purified UMG Silicon obtained with the PHOTOSIL process. In this feedstock the Boron and Phosphorus concentrations measured by GDMS were found to be 0.3 ppmw and 2 ppmw, respectively. The resulting ingot is n-type, fully mono c1 rystalline and has a resistivity range from 0.2 to 1 ohm.cm. Other impurities, especially metals, were not detectable with the analysis techniques applied (GDMS, ICP-OES). The ingot was cut into 125×125 mm2 pseudo square wafers of 180 micron thickness. A first series of solar cells were processed on these wafers using an industrial hetero-junction process by Roth & Rau. The best solar cell from a batch of 14 had an energy conversion efficiency of 19.0% (compared to an average: 18.6%) under standard testing conditions with a very high Voc of 725mV.. An independent confirmation of these results is pending.
Keywords :
boron; electrical resistivity; ingots; phosphorus; silicon; solar cells; CP-OES; GDMS; ICP-OES; boron concentrations; boron-oxygen complex; conversion efficiency; efficiency heterojunction solar cells; high efficiency low cost solar cells; highly purified n-type UMG silicon; inch mono-c Cz silicon ingot; light induced degradation; micronthickness; n-type silicon; nonblended upgraded metallurgical silicon; phosphorus concentrations; pseudo square wafers; residual metal impurities; resistivity; standard testing conditions; wafers; Boron; Conductivity; Degradation; Impurities; Photovoltaic cells; Silicon; Cz; UMG; high efficiency cells; n-type;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference (PVSC), 2012 38th IEEE
Conference_Location :
Austin, TX
ISSN :
0160-8371
Print_ISBN :
978-1-4673-0064-3
Type :
conf
DOI :
10.1109/PVSC.2012.6318266
Filename :
6318266
Link To Document :
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