• DocumentCode
    3525496
  • Title

    Non-parametric Bayesian dictionary learning for image super resolution

  • Author

    Li He ; Hairong Qi ; Zaretzki, Russell

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., Univ. of Tennessee, Knoxville, TN, USA
  • fYear
    2011
  • fDate
    7-8 Nov. 2011
  • Firstpage
    122
  • Lastpage
    125
  • Abstract
    This paper addresses the problem of generating a super-resolution (SR) image from a single low-resolution input image. A non-parametric Bayesian method is implemented to train the over-complete dictionary. The first advantage of using non-parametric Bayesian approach is the number of dictionary atoms and their relative importance may be inferred non-parametrically. In addition, sparsity level of the coefficients may be inferred automatically. Finally, the non-parametric Bayesian approach may learn the dictionary in situ. Two previous state-of-the-art methods including the efficient ℓ1 method and the (K-SVD) are implemented for comparison. Although the efficient ℓ1 method overall produces the best quality super-resolution images, the 837-atom dictionary trained by non-parametric Bayesian method produces super-resolution images that very close to quality of images produced by the 1024-atom efficient ℓ1 dictionary. Finally, the non-parametric Bayesian method has the fastest speed in training the over-complete dictionary.
  • Keywords
    belief networks; image resolution; learning (artificial intelligence); nonparametric statistics; ℓ1 method; K-SVD; dictionary atoms; dictionary learning; image quality; image super resolution; nonparametric Bayesian dictionary learning; over-complete dictionary training; single low-resolution input image; sparse representation method; sparsity level; Bayes methods; Dictionaries; Image reconstruction; Image resolution; Interpolation; Signal resolution; Training; Single-image super resolution; non-parametric Bayesian; over-complete dictionary learning;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Future of Instrumentation International Workshop (FIIW), 2011
  • Conference_Location
    Oak Ridge, TN
  • Print_ISBN
    978-1-4673-5835-4
  • Type

    conf

  • DOI
    10.1109/FIIW.2011.6476831
  • Filename
    6476831