DocumentCode :
3525620
Title :
Dielectric spectroscopy in Silicone Rubber Incorporating Nanofillers
Author :
Pérez, N. Andrés ; Sylvestre, A. ; Augé, J.L. ; Do, M.T. ; Rowe, S.
Author_Institution :
Electrostatic & Dielectr. Mater. Lab. LEMD, CNRS, Grenoble
fYear :
2006
fDate :
15-18 Oct. 2006
Firstpage :
453
Lastpage :
456
Abstract :
Dielectric isothermal spectroscopy is performed on micro composite and micro/nano composite silicone rubber in the ranges of temperature and frequency of [113-293 K] and [10-1-106 Hz] respectively. Two specimen have been studied: i) a commercial liquid silicone rubber LSR containing `micro-sized\´ fumed silica fillers; ii) the same silicone rubber in which we added 0.10 weight fraction of nano SiOx particles. A comparison of their dielectric responses (real epsiv\´ and imaginary epsiv" parts of dielectric permittivity) is presented. For the commercial LSR without nano SiOx, typical values of epsiv\´ and epsiv" have been obtained. As plotted against the temperature (at a fixed frequency) epsiv\´ and epsiv" present a maximum around 155 K which is attributed to the a relaxation around the glass transition. A strong relaxation peak is observed as nano particles are added in the commercial silicone rubber. The more probable phenomenon to explain this peak is the adsorption of water at the filler surface before mixing.
Keywords :
nanocomposites; permittivity; silicone rubber; silicone rubber insulators; 10-1 to 106 Hz; 113 to 293 K; SiOx; dielectric isothermal spectroscopy; dielectric permittivity; filler surface; glass transition; liquid silicone rubber; micro-sized fumed silica fillers; microcomposite silicone rubber; nano SiOx particles; nanocomposite silicone rubber; silicone rubber incorporating nanofillers; Dielectric materials; Dielectric measurements; Electrochemical impedance spectroscopy; Frequency; Nanoparticles; Permittivity; Polymers; Rubber; Silicon compounds; Temperature distribution;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Insulation and Dielectric Phenomena, 2006 IEEE Conference on
Conference_Location :
Kansas City, MO
Print_ISBN :
1-4244-0547-5
Electronic_ISBN :
1-4244-0547-5
Type :
conf
DOI :
10.1109/CEIDP.2006.311967
Filename :
4105468
Link To Document :
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