DocumentCode :
3525689
Title :
Statistical analysis of in service failed epoxy resin bushings in a 50 kV switchgear assembly
Author :
Jongen, R.A. ; Morshuis, P.H.F. ; Smit, J.J. ; Janssen, A.L.J. ; Gulski, E.
Author_Institution :
Delft Univ. of Technol.
fYear :
2006
fDate :
15-18 Oct. 2006
Firstpage :
469
Lastpage :
472
Abstract :
In the 1960´s up to the 1980´s a very compact oil-filled switchgear assembly was installed in the 50 kV networks of different utilities in the Netherlands. Per bay the switchgear consists of different oil-filled compartments where the high voltage parts are supported and connected from one compartment to the other by epoxy resin bushings. The population of this type of bushing is relative large. The number of failures however is low, and most of them occurred in the early nineties. This initiated a concern about the possibility of an oncoming re-investment wave due to replacement of this type of circuit breaker. In this contribution a statistical analysis of failure data was performed for failure prediction in the future. From the statistical analysis it can be concluded that the bushings are in the wear-out life period of the bathtub curve. However, the relative low value of the shape parameter indicates that the ageing process is in its early stage. If the failure rate function obtained from the analysis is compared with the population in service, than the total population can be stated as young. With the analysis an estimate is made of the expected number of failures in coming years, which can help the asset manager to determine if action has to be taken to meet the business policy
Keywords :
ageing; bushings; circuit breakers; failure analysis; insulating oils; maintenance engineering; polymer insulators; statistical analysis; switchgear insulation; 50 kV; ageing process; circuit breaker; failure prediction; failure rate function; in service failed epoxy resin bushings; oil-filled switchgear assembly; statistical analysis; wear-out life period; Aging; Assembly; Circuit breakers; Epoxy resins; Failure analysis; Insulators; Shape; Statistical analysis; Switchgear; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Insulation and Dielectric Phenomena, 2006 IEEE Conference on
Conference_Location :
Kansas City, MO
Print_ISBN :
1-4244-0547-5
Electronic_ISBN :
1-4244-0547-5
Type :
conf
DOI :
10.1109/CEIDP.2006.311971
Filename :
4105472
Link To Document :
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