• DocumentCode
    3525717
  • Title

    Improved condition assessment of XLPE insulated cables using the isothermal relaxation current technique

  • Author

    Oyegoke, B.S.

  • Author_Institution
    Queensland Univ. of Technol., Brisbane, Qld.
  • fYear
    2006
  • fDate
    15-18 Oct. 2006
  • Firstpage
    477
  • Lastpage
    480
  • Abstract
    Well-known procedures using the isothermal relaxation current method (IRC) use an empirically-derived ageing factor (the A-factor) to estimate the condition of cables. The A-factor is calculated from plots of the product of instantaneous value of IRC and the time to that value from the start of the current, against the log of time. A-factors are computed from a standard formula using constants determined from curve fits of measured depolarization currents. From measurements of the breakdown strength of samples of real and degraded cables it has been found that A-factors do not provide reliable estimates of XLPE cable condition. However, if semi-conducting material of the cable insulation is known and cables are classified according to semi-conducting material type it is possible to get better correlation between conditions of cables as indicated by A-factors and AC breakdown voltage. This paper contains a novel analysis of result from previous researcher and also includes result from tests on other cables. The refined procedure is found to give reasonable value of A-factor for all cable tested.
  • Keywords
    XLPE insulation; ageing; power cable insulation; AC breakdown voltage; XLPE insulated cables; breakdown strength; cable insulation; depolarization currents; empirically-derived ageing factor; isothermal relaxation current technique; semiconducting material; Aging; Cable insulation; Cables; Current measurement; Degradation; Dielectrics and electrical insulation; Isothermal processes; System testing; Trees - insulation; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation and Dielectric Phenomena, 2006 IEEE Conference on
  • Conference_Location
    Kansas City, MO
  • Print_ISBN
    1-4244-0547-5
  • Electronic_ISBN
    1-4244-0547-5
  • Type

    conf

  • DOI
    10.1109/CEIDP.2006.311973
  • Filename
    4105474