Title :
Doppler continuous wave scanning acoustic microscope
Author :
Titov, S.A. ; Maev, R.G.
Author_Institution :
Center for Imaging Res. & Adv. Mater. Characterization, Windsor Univ., Ont., Canada
Abstract :
A modification of V(z) method is presented in this paper. It is proposed to use the Doppler effect in the continuous wave reflection scanning acoustic microscope. The Doppler frequency shift is created due to constant velocity movement of the lens perpendicular to the sample surface. A Doppler continuous wave microscope with an operating frequency of 300 MHz was developed. The device was tested on the investigations of the materials with known acoustical parameters
Keywords :
Doppler measurement; acoustic microscopes; 300 MHz; Doppler continuous wave reflection scanning acoustic microscope; V(z) method; Acoustic devices; Acoustic reflection; Acoustic testing; Acoustic waves; Doppler effect; Frequency; Lenses; Materials testing; Microscopy; Surface acoustic wave devices;
Conference_Titel :
Ultrasonics Symposium, 1997. Proceedings., 1997 IEEE
Conference_Location :
Toronto, Ont.
Print_ISBN :
0-7803-4153-8
DOI :
10.1109/ULTSYM.1997.663117
