DocumentCode :
3525767
Title :
Effects of X-Ray Radiation on Solid Insulating Materials
Author :
Sudalaimuthu, S. ; Thomas, M. Joy ; Senthil Kumar, S. ; Vinod Kumar, V.
Author_Institution :
Dept. of Electr. Eng., Indian Inst. of Sci., Bangalore
fYear :
2006
fDate :
15-18 Oct. 2006
Firstpage :
489
Lastpage :
492
Abstract :
In the present work an attempt has been made to study the effects of ionizing radiation such as X-ray irradiation on the electrical properties of solid insulating materials such as FR4 laminates and relate these to concurrent changes in the physical and chemical properties of the above material. FR4 laminates find extensive use as an insulating material in PCB´s where HV power supply components are mounted in X-ray generators. In the present work samples of FR4 laminates were irradiated in ambient air with X-rays to different absorbed doses of up to 6.3 times 104 rad. The post irradiation effects on the material shows deterioration in electrical properties such as dielectric strength, dissipation factor, volume resistivity and surface resistivity. Analysis by FTIR indicates that when samples are irradiated in air, it exhibits increase of hydroxyl groups and decrease of all the characteristic infrared bands of the initial chemical functions. SEM photographs show newer defects generated in the irradiated sample. There is also a change in color of the material when exposed to X-rays and this is due to the fact that X-ray initiated free charge gets trapped by the defects/impurities and changes the absorption characteristic of the material. In addition, the decrease in crystallinity and increase in surface roughness was monitored by Differential Scanning Calorimetry and contact type profilometer.
Keywords :
Fourier transform spectra; X-ray effects; composite insulating materials; differential scanning calorimetry; electric strength; electrical resistivity; infrared spectra; laminates; permittivity; scanning electron microscopy; surface roughness; FR4 laminates; FTIR spectra; Fourier transform infrared; HV power supply; SEM photographs; X-ray generators; X-ray radiation effect; contact type profilometer; dielectric strength; differential scanning calorimetry; dissipation factor; electrical properties; free charge; hydroxyl groups; infrared bands; ionizing radiation effect; scanning electron microscopy; solid insulating materials; surface resistivity; surface roughness; volume resistivity; Chemical analysis; Conductivity; Crystalline materials; Dielectric materials; Dielectrics and electrical insulation; Ionizing radiation; Laminates; Power generation; Power supplies; Solids;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Insulation and Dielectric Phenomena, 2006 IEEE Conference on
Conference_Location :
Kansas City, MO
Print_ISBN :
1-4244-0547-5
Electronic_ISBN :
1-4244-0547-5
Type :
conf
DOI :
10.1109/CEIDP.2006.311976
Filename :
4105477
Link To Document :
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