• DocumentCode
    3525988
  • Title

    Anomalies of the field emission from a nanoheterostructured surfaces of the W and Mo needle-shaped microcrystals

  • Author

    Ptitsin, V.E.

  • Author_Institution
    Inst. for Anal. Instrum., Russian Acad. of Sci., St. Petersburg, Russia
  • fYear
    2009
  • fDate
    20-24 July 2009
  • Firstpage
    107
  • Lastpage
    108
  • Abstract
    A study of the field emission properties of ZrO2/W and ZrO2/Mo nanoheterostructures is presented. The nanoheterostructure (NHS) was represented by a thin (~3-10 nm) ZrO2 layer at the tip of a needle-shaped W<100>, W<111>, Mo<100> and Mo<111> microcrystals (MC). It is established, that at temperature of NHS substance ~ (1900plusmn100)K process of thermal field electron emission is activated at rather low values of intensity extraction fields (less ~30-50 V/mum). It is shown, that in a stationary mode of a thermal field electron emission from the investigated NHS surfaces the density of an emission current achieves abnormal high values (the order ~108 A/cm2) and a normalized brightness of an emitted electrons flux can make ~106 A/(cm2 sr V). The revealed phenomenon of a sharp rise in emissive ability of the ZrO2/W and ZrO2/Mo NHSs in the certain range of ZrO2 layer thicknesses and nanoheterostructured substance temperatures was named "abnormal thermal field emission" (ATFE).
  • Keywords
    crystal microstructure; electron field emission; molybdenum; nanostructured materials; tungsten; zirconium compounds; ZrO2-Mo; ZrO2-W; abnormal thermal field emission; emission current density; emissive ability; intensity extraction fields; nanoheterostructured surfaces; needle-shaped microcrystals; normalized brightness; thermal field electron emission; Atomic layer deposition; Brightness; Carbon dioxide; Current density; Electron emission; Instruments; Resistance heating; Stability; Temperature dependence; Temperature distribution;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vacuum Nanoelectronics Conference, 2009. IVNC 2009. 22nd International
  • Conference_Location
    Shizuoka
  • Print_ISBN
    978-1-4244-3587-6
  • Electronic_ISBN
    978-1-4244-3588-3
  • Type

    conf

  • DOI
    10.1109/IVNC.2009.5271567
  • Filename
    5271567