DocumentCode :
3525988
Title :
Anomalies of the field emission from a nanoheterostructured surfaces of the W and Mo needle-shaped microcrystals
Author :
Ptitsin, V.E.
Author_Institution :
Inst. for Anal. Instrum., Russian Acad. of Sci., St. Petersburg, Russia
fYear :
2009
fDate :
20-24 July 2009
Firstpage :
107
Lastpage :
108
Abstract :
A study of the field emission properties of ZrO2/W and ZrO2/Mo nanoheterostructures is presented. The nanoheterostructure (NHS) was represented by a thin (~3-10 nm) ZrO2 layer at the tip of a needle-shaped W<100>, W<111>, Mo<100> and Mo<111> microcrystals (MC). It is established, that at temperature of NHS substance ~ (1900plusmn100)K process of thermal field electron emission is activated at rather low values of intensity extraction fields (less ~30-50 V/mum). It is shown, that in a stationary mode of a thermal field electron emission from the investigated NHS surfaces the density of an emission current achieves abnormal high values (the order ~108 A/cm2) and a normalized brightness of an emitted electrons flux can make ~106 A/(cm2 sr V). The revealed phenomenon of a sharp rise in emissive ability of the ZrO2/W and ZrO2/Mo NHSs in the certain range of ZrO2 layer thicknesses and nanoheterostructured substance temperatures was named "abnormal thermal field emission" (ATFE).
Keywords :
crystal microstructure; electron field emission; molybdenum; nanostructured materials; tungsten; zirconium compounds; ZrO2-Mo; ZrO2-W; abnormal thermal field emission; emission current density; emissive ability; intensity extraction fields; nanoheterostructured surfaces; needle-shaped microcrystals; normalized brightness; thermal field electron emission; Atomic layer deposition; Brightness; Carbon dioxide; Current density; Electron emission; Instruments; Resistance heating; Stability; Temperature dependence; Temperature distribution;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Vacuum Nanoelectronics Conference, 2009. IVNC 2009. 22nd International
Conference_Location :
Shizuoka
Print_ISBN :
978-1-4244-3587-6
Electronic_ISBN :
978-1-4244-3588-3
Type :
conf
DOI :
10.1109/IVNC.2009.5271567
Filename :
5271567
Link To Document :
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