DocumentCode :
3526172
Title :
Forecasting Transformer Reliability
Author :
Van Schijndel, A. ; Wetzer, Jos M. ; Wouters, P.A.A.F.
Author_Institution :
Group Electr. Power Syst., Eindhoven Univ. of Technol.
fYear :
2006
fDate :
15-18 Oct. 2006
Firstpage :
577
Lastpage :
582
Abstract :
In this paper the concept of an integral transformer lifetime model is presented. The model provides the best possible prediction of future behaviour given the data available. It treats remaining life in terms of future failure probability, thereby giving better support to the decision taking process than a mere remaining life estimate. The core of the model is a generic description of ageing processes, coupled to a probabilistic approach. The approach presented utilizes various techniques to reduce the uncertainty that is inherent to modelling processes with incomplete knowledge of the operational history. One technique couples the process model to externally measurable quantities; another technique involves a sensitivity analysis, which shows what additional input data gives the most efficient way to improve accuracy. We will illustrate the approach by applying it to a well-known degradation process: thermal degradation of the transformer winding insulation.
Keywords :
failure analysis; power system reliability; power transformer insulation; power transformers; sensitivity analysis; ageing processes; degradation process; failure probability; integral transformer lifetime model; probabilistic approach; sensitivity analysis; thermal degradation; transformer reliability forecasting; transformer winding insulation; Aging; Power measurement; Power system modeling; Power system reliability; Power transformer insulation; Power transformers; Predictive models; Thermal degradation; Transformer cores; Windings;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Insulation and Dielectric Phenomena, 2006 IEEE Conference on
Conference_Location :
Kansas City, MO
Print_ISBN :
1-4244-0547-5
Electronic_ISBN :
1-4244-0547-5
Type :
conf
DOI :
10.1109/CEIDP.2006.311998
Filename :
4105499
Link To Document :
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