Title : 
Design of a hard X-ray polarimeter: X-Calibur
         
        
            Author : 
Guo, Qingzhen ; Garson, Alfred ; Beilicke, Matthias ; Martin, Jerrad ; Lee, Kuen ; Krawczynski, Henric
         
        
            Author_Institution : 
Dept. of Phys., Washington Univ. in St. Louis, St. Louis, MO, USA
         
        
        
            fDate : 
Oct. 30 2010-Nov. 6 2010
         
        
        
        
            Abstract : 
We report on Monte Carlo studies of the hard X-ray polarimeter X-Calibur. The polarimeter will be used in the focal plane of a grazing incidence hard X-ray telescope. It combines a low-Z Compton scatterer with a high-Z Cadmium Zinc Telluride (CZT) detector assembly to measure the polarization of 10 keV - 80 keV X-rays. X-Calibur makes use of the fact that polarized photons Compton scatter preferentially perpendicular to the electric field orientation. In contrast of competing designs which use only a small fraction of the incoming X-rays, X-Calibur achieves a high detection efficiency of order unity. In this contributions, we discuss a Monte Carlo study which compares X-Calibur´s polarimeteric performance achieved using different scattering materials (Scintillator, Be, LiH, Li), and calculate the sensitivity of X-Calibur when used with different balloon-borne and space-borne mirror assemblies.
         
        
            Keywords : 
Compton effect; Monte Carlo methods; X-ray detection; polarimeters; scintillation counters; Monte Carlo method; X-Calibur polarimeteric performance; balloon-borne assembly; electric field orientation; hard X-ray polarimeter design; hard X-ray telescope; high detection efficiency; high-Z Cadmium Zinc Telluride detector; low-Z Compton scatterering; polarization measurement; scintillator detector; space-borne mirror assembly; Assembly; Detectors; Extraterrestrial measurements; Materials; Modulation; Photonics; Scattering;
         
        
        
        
            Conference_Titel : 
Nuclear Science Symposium Conference Record (NSS/MIC), 2010 IEEE
         
        
            Conference_Location : 
Knoxville, TN
         
        
        
            Print_ISBN : 
978-1-4244-9106-3
         
        
        
            DOI : 
10.1109/NSSMIC.2010.5873783