DocumentCode
3526520
Title
In-situ TEM observation and electrical measurement of gold nanocontact during tensile test using MEMS opposing tips
Author
Ishida, Tadashi ; Kakushima, Kuniyuki ; Fujita, Hiroyuki
Author_Institution
Inst. of Ind. Sci., Tokyo, Japan
fYear
2009
fDate
20-24 July 2009
Firstpage
169
Lastpage
170
Abstract
Gold nanocontact was formed between gold opposing tips in the ultra high vacuum transmission electron microscope (TEM). Quantum changes in conductance were observed at room temperature during the thinning process of the nanocontact. In the nanotechnology research, it is essential to study the relationship between the shape and the characteristic at a nano scale. The characteristics of nano structures can be easily affected by the atomic sized shape change because even such minute shape changes are not negligible as compared to nano structures. In order to investigate the effect, one of the promising approaches is the real time observation of nano scopic change in a nano structure, while its characteristics are measured. However, it is extraordinary difficult to observe nano scaled structural change in real time. We have developed MEMS (microelectromechanical systems)-in-TEM system to tackle this difficult issue. As for the nano scaled structural change, MEMS technology can provide tips as sharp as tens of nanometers; by pushing them together a nano contact is formed. MEMS actuators that are very stable and precise are able to pull and deform the contact very slowly. In addition, TEM is a powerful tool for a real time observation at a nano scale. Therefore, we introduced MEMS opposing tips into TEM in order to visualize the structural deformation at a contact point between tips.
Keywords
gold; micromechanical devices; nanocontacts; nanostructured materials; transmission electron microscopes; MEMS opposing tips; MEMS technology; TEM observation; atomic sized shape; electrical measurement; gold nanocontact; gold opposing tips; microelectromechanical systems-in-TEM system; nanoscaled structural change; nanoscopic change; nanostructures; nanotechnology research; real time observation; tensile test; thinning process; ultra high vacuum transmission electron microscope; Actuators; Atomic measurements; Electric variables measurement; Gold; Micromechanical devices; Nanotechnology; Shape; Temperature; Testing; Transmission electron microscopy;
fLanguage
English
Publisher
ieee
Conference_Titel
Vacuum Nanoelectronics Conference, 2009. IVNC 2009. 22nd International
Conference_Location
Shizuoka
Print_ISBN
978-1-4244-3587-6
Electronic_ISBN
978-1-4244-3588-3
Type
conf
DOI
10.1109/IVNC.2009.5271597
Filename
5271597
Link To Document