• DocumentCode
    3526520
  • Title

    In-situ TEM observation and electrical measurement of gold nanocontact during tensile test using MEMS opposing tips

  • Author

    Ishida, Tadashi ; Kakushima, Kuniyuki ; Fujita, Hiroyuki

  • Author_Institution
    Inst. of Ind. Sci., Tokyo, Japan
  • fYear
    2009
  • fDate
    20-24 July 2009
  • Firstpage
    169
  • Lastpage
    170
  • Abstract
    Gold nanocontact was formed between gold opposing tips in the ultra high vacuum transmission electron microscope (TEM). Quantum changes in conductance were observed at room temperature during the thinning process of the nanocontact. In the nanotechnology research, it is essential to study the relationship between the shape and the characteristic at a nano scale. The characteristics of nano structures can be easily affected by the atomic sized shape change because even such minute shape changes are not negligible as compared to nano structures. In order to investigate the effect, one of the promising approaches is the real time observation of nano scopic change in a nano structure, while its characteristics are measured. However, it is extraordinary difficult to observe nano scaled structural change in real time. We have developed MEMS (microelectromechanical systems)-in-TEM system to tackle this difficult issue. As for the nano scaled structural change, MEMS technology can provide tips as sharp as tens of nanometers; by pushing them together a nano contact is formed. MEMS actuators that are very stable and precise are able to pull and deform the contact very slowly. In addition, TEM is a powerful tool for a real time observation at a nano scale. Therefore, we introduced MEMS opposing tips into TEM in order to visualize the structural deformation at a contact point between tips.
  • Keywords
    gold; micromechanical devices; nanocontacts; nanostructured materials; transmission electron microscopes; MEMS opposing tips; MEMS technology; TEM observation; atomic sized shape; electrical measurement; gold nanocontact; gold opposing tips; microelectromechanical systems-in-TEM system; nanoscaled structural change; nanoscopic change; nanostructures; nanotechnology research; real time observation; tensile test; thinning process; ultra high vacuum transmission electron microscope; Actuators; Atomic measurements; Electric variables measurement; Gold; Micromechanical devices; Nanotechnology; Shape; Temperature; Testing; Transmission electron microscopy;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vacuum Nanoelectronics Conference, 2009. IVNC 2009. 22nd International
  • Conference_Location
    Shizuoka
  • Print_ISBN
    978-1-4244-3587-6
  • Electronic_ISBN
    978-1-4244-3588-3
  • Type

    conf

  • DOI
    10.1109/IVNC.2009.5271597
  • Filename
    5271597