Title :
In situ transmission-electron-microscope observation of electron-beam-deposited Pt field emitter under field emission and field evaporation
Author :
Murakami, K. ; Matsubara, N. ; Ichikawa, S. ; Wakaya, F. ; Takai, M.
Author_Institution :
Center for Quantum Sci. & Technol., Osaka Univ., Toyonaka, Japan
Abstract :
In this study, the structural changes in the electron beam-deposited Pt field emitter under field emission and field evaporation were investigated by in situ transmission-electron-microscope (TEM) observation. The structure of the Pt field emitter was found to be unchanged under field emission with an emission current of less than 480 nA. On the contrary, the top of the Pt field emitter was found to be sharpened after field evaporation. The Pt nanocrystals were found to move to the Pt tip top after field evaporation. These results indicated the possibility of the improvement of field emission properties by field evaporation.
Keywords :
electron field emission; field evaporation; nanostructured materials; platinum; transmission electron microscopy; Pt; TEM; electron-beam-deposited field emitter; field emission; field evaporation; in situ transmission electron microscope; platinum nanocrystals; structural property; Amorphous materials; Annealing; Carbon dioxide; Electron beams; Electron emission; Interference; Nanocrystals; Nanotechnology; Tungsten; Voltage;
Conference_Titel :
Vacuum Nanoelectronics Conference, 2009. IVNC 2009. 22nd International
Conference_Location :
Shizuoka
Print_ISBN :
978-1-4244-3587-6
Electronic_ISBN :
978-1-4244-3588-3
DOI :
10.1109/IVNC.2009.5271598
