• DocumentCode
    3526742
  • Title

    SNM detection based on X-ray scattering

  • Author

    Huang, Weiqi ; Yang, Yigang ; Li, Yuanjing ; Wang, Bairong ; Xiao, Yongshun

  • fYear
    2010
  • fDate
    Oct. 30 2010-Nov. 6 2010
  • Firstpage
    528
  • Lastpage
    530
  • Abstract
    We present in this paper the study ofspecial nuclear materials(SNM) detection method based on Pair production and Compton scattering Atomic Number Identification (PCANI) technique. PCANI, a technique that uses the information of annihilation and Compton scattered photons from target is applied at first to achieve the atomic number(Z) identification. Because of the Z2 and Z1 relationship of pair production cross section and Compton scattering cross section with Z, the ratio of 511keV γ number versus scattered γ number is proportional to Z, which gives us a chance to know what the atom is. PCANI is sensitive to high Z materials so it is not difficult to separate heavy metal from common goods that are mixed together in cargoes. The results of Monte Carlo calculations show that PCANI method can identify elements effectively, especially for high Z materials such as SNM. An experimental facility based on 7 MeV LINAC has been setup for feasibility study. Annihilation and backscattered photons have been observed with LaBr3(Ce) detector. Preliminary results show that high Z materials can be discriminated successfully.
  • Keywords
    Compton effect; Monte Carlo methods; X-ray scattering; nuclear criticality safety; solid scintillation detectors; Compton scattered photons; LINAC; LaBr3(Ce) detector; Monte Carlo calculations; PCANI technique; Pair production and Compton scattering Atomic Number Identification; SNM detection method; X-ray scattering; Z materials; gamma number; improvised nuclear devices; pair production cross section; special nuclear materials; Atomic measurements; Detectors; Materials; Photonics; Production; Scattering; Sensitivity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium Conference Record (NSS/MIC), 2010 IEEE
  • Conference_Location
    Knoxville, TN
  • ISSN
    1095-7863
  • Print_ISBN
    978-1-4244-9106-3
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2010.5873817
  • Filename
    5873817